Nicolet Almega XR Dispersive Raman spectrometer

CURRENTLY UNAVAILABLE

An Almega XR Raman spectrometer was purchased from Thermo Electron in 2007. This high performance dispersive Raman spectrometer can be used for identification and quantification of both organic and inorganic materials. The system is equipped with an Olympus BX51 microscope with motorized stage, mapping capabilities, and spatial resolution down to 1 um.

The "Omnic™ for Almega 7" analytical-software package includes fluorescence correction with all excitation frequencies as well as search and example libraries, spectral interpretation guide, data collection, and manipulation functionality.

The system was retired from service in September 2019.

Instrument Specifications

Performance Features
  • Almega XR 780nm (NIR) laser (100-3100cm-1 Raman shift)
  • Almega XR 532nm (green) laser (100-4000 cm-1 Raman shift)
  • Spectral resolution 2cm-1 FWHM (1cm-1per CCD pixel element)
  • Spatial resolution (diffraction limited) down to 1um
  • Confocal depth profiling resolution down to 2um
 Microscope
  • Olympus BX51 microscope, reflection illuminator
  • Confocal optics with confocal aperture
  • Automated system calibration
  • Fully automated optical alignment
  • 2" x 3" travel stage
  • Working distance objectives 10x, 20x, 50x, 100x
Software
  • OMNIC™ for Almega 8.3 including:
  • Search libraries, spectral interpretation guide
  • TQ Analyst Professional Addition
  • Atlus™ Microscopy software 8.3 for Almega

 

 Detectors
  • High sensitivity, TE-cooled silicon CCD array detector
  • High and low resolution grating for each wavelength
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